TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_03_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-015-05 | FUSED_ID : 6359364768390725877
  IC_TEMP :  -88.61 | VDDM : 1122.60 | AUX_INT :  -11.36 | CsaBias :   51.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.08003e-03 / 2
  ADC_P0  : -1.13581e-02 ± 3.09451e-02
  ADC_P1  : 8.96054e-03 ± 7.96061e-04
  ADC_P2  : -6.86538e-06 ± 4.09282e-06
  CSA_Chi2/NDF : 1.61735e-04 / 2
  CSA_P0  : 5.68712e-02 ± 8.48250e-03
  CSA_P1  : 1.04717e-02 ± 6.39096e-04
  CSA_P2  : -7.11053e-05 ± 9.73267e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 17, 44, 55, 78, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [16, 61, 104, 105, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3879', '1.800', '0.1294', '1.800', '0.0977', '7.000', '0.7079', 1, 1, 1, 1, 1725001403.0110965]
VI_after__Init : ['1.201', '0.3898', '1.800', '0.1298', '1.800', '0.0919', '7.000', '0.7078', 1, 1, 1, 1, 1725001411.231436]
VI_at__the_End : ['1.201', '0.4322', '1.800', '0.1289', '1.799', '0.1296', '7.000', '0.7085', 1, 1, 1, 1, 1725001473.2854822]