TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_04_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-016-02 | FUSED_ID : 6359364768390725890
  IC_TEMP : -191.43 | VDDM : 1345.65 | AUX_INT :  205.02 | CsaBias : 1233.61
  CONF_FAIL_REG : 3244
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.30403e-02 / 2
  ADC_P0  : 2.05022e-01 ± 1.52323e-01
  ADC_P1  : 1.04110e-02 ± 6.61679e-03
  ADC_P2  : -2.09405e-05 ± 4.12633e-05
  CSA_Chi2/NDF : 1.38885e-03 / 2
  CSA_P0  : 1.89290e-01 ± 2.48571e-02
  CSA_P1  : 1.51808e-03 ± 1.87280e-03
  CSA_P2  : -7.84200e-07 ± 2.85206e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [31, 45, 77, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [23, 38, 45, 46, 47, 53, 57, 66, 83, 118, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2341', '1.800', '0.1746', '1.731', '0.1501', '7.000', '0.7083', 1, 1, 1, 1, 1725001499.0305994]
VI_after__Init : ['1.202', '0.2344', '1.800', '0.1758', '1.727', '0.1501', '7.000', '0.7077', 1, 1, 1, 1, 1725001507.1778686]
VI_at__the_End : ['1.201', '0.2942', '1.800', '0.1142', '1.756', '0.1501', '7.000', '0.7083', 1, 1, 1, 1, 1725001568.2481701]