TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_18_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-019-01 | FUSED_ID : 6359364768390734129
  IC_TEMP :  -74.09 | VDDM : 1123.58 | AUX_INT :  -10.61 | CsaBias :   67.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73714e-03 / 2
  ADC_P0  : -1.06099e-02 ± 2.82473e-02
  ADC_P1  : 8.71072e-03 ± 7.08748e-04
  ADC_P2  : -6.45416e-06 ± 3.55076e-06
  CSA_Chi2/NDF : 1.73944e-04 / 2
  CSA_P0  : 5.79403e-02 ± 8.79684e-03
  CSA_P1  : 1.05402e-02 ± 6.62778e-04
  CSA_P2  : -6.45572e-05 ± 1.00933e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 2, 32, 33, 37, 64, 83, 108, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [24, 25, 27, 45, 48, 53, 67, 71, 109, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3524', '1.800', '0.1481', '1.799', '0.0982', '7.000', '0.7066', 1, 1, 1, 1, 1725005913.4066157]
VI_after__Init : ['1.201', '0.3530', '1.800', '0.1481', '1.800', '0.0922', '7.000', '0.7069', 1, 1, 1, 1, 1725005921.4539924]
VI_at__the_End : ['1.201', '0.4587', '1.800', '0.1347', '1.799', '0.1232', '7.000', '0.7075', 1, 1, 1, 1, 1725005982.4514806]