TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_08_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-024-11 | FUSED_ID : 6359364768390750603
  IC_TEMP :  -71.18 | VDDM : 1195.42 | AUX_INT : -687.89 | CsaBias : -480.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34116e-02 / 2
  ADC_P0  : -6.87890e-01 ± 2.00873e-01
  ADC_P1  : 1.93226e-02 ± 4.15953e-03
  ADC_P2  : -4.48518e-05 ± 1.74489e-05
  CSA_Chi2/NDF : 1.49170e-04 / 2
  CSA_P0  : 5.71118e-02 ± 8.14636e-03
  CSA_P1  : 1.02652e-02 ± 6.13770e-04
  CSA_P2  : -5.11742e-05 ± 9.34699e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [6, 11, 15, 18, 27, 32, 46, 61, 63, 100, 102, 104, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [11, 57]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3341', '1.800', '0.1736', '1.800', '0.0932', '7.000', '0.7071', 1, 1, 1, 1, 1725016096.3392165]
VI_after__Init : ['1.201', '0.3343', '1.800', '0.1736', '1.800', '0.0876', '7.000', '0.7072', 1, 1, 1, 1, 1725016104.3936837]
VI_at__the_End : ['1.201', '0.4955', '1.800', '0.1377', '1.801', '0.1122', '7.000', '0.7078', 1, 1, 1, 1, 1725016167.3408377]