TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_14_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-027-06 | FUSED_ID : 6359364768390754742
  IC_TEMP :  -62.35 | VDDM : 1206.51 | AUX_INT : -1036.23 | CsaBias : -755.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.73475e-02 / 2
  ADC_P0  : -1.03623e+00 ± 5.05837e-01
  ADC_P1  : 2.40844e-02 ± 9.64513e-03
  ADC_P2  : -6.03428e-05 ± 3.83505e-05
  CSA_Chi2/NDF : 1.31573e-04 / 2
  CSA_P0  : 5.86348e-02 ± 7.65077e-03
  CSA_P1  : 9.90044e-03 ± 5.76430e-04
  CSA_P2  : -4.77486e-05 ± 8.77835e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [6, 49, 69, 84, 90, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [15, 20, 30, 69]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3033', '1.800', '0.1645', '1.800', '0.0955', '7.000', '0.7075', 1, 1, 1, 1, 1725016481.9711342]
VI_after__Init : ['1.201', '0.3033', '1.800', '0.1645', '1.800', '0.0899', '7.000', '0.7076', 1, 1, 1, 1, 1725016490.2646694]
VI_at__the_End : ['1.201', '0.4889', '1.800', '0.1337', '1.800', '0.1125', '7.000', '0.7085', 1, 1, 1, 1, 1725016555.2541957]