TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_36_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-027-14 | FUSED_ID : 6359364768390758846
  IC_TEMP :  -74.94 | VDDM : 1197.24 | AUX_INT : -1078.30 | CsaBias : -808.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.20908e-02 / 2
  ADC_P0  : -1.07830e+00 ± 4.85656e-01
  ADC_P1  : 2.52255e-02 ± 9.40334e-03
  ADC_P2  : -6.51238e-05 ± 3.80610e-05
  CSA_Chi2/NDF : 1.41902e-04 / 2
  CSA_P0  : 5.85906e-02 ± 7.94542e-03
  CSA_P1  : 9.83275e-03 ± 5.98630e-04
  CSA_P2  : -4.76580e-05 ± 9.11643e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [11, 18, 33, 60, 67, 82, 89, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [15, 25, 114, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2668', '1.800', '0.1543', '1.800', '0.0978', '7.000', '0.7070', 1, 1, 1, 1, 1725021374.5072203]
VI_after__Init : ['1.202', '0.2667', '1.800', '0.1544', '1.801', '0.0921', '7.000', '0.7070', 1, 1, 1, 1, 1725021383.3465815]
VI_at__the_End : ['1.202', '0.4840', '1.800', '0.1335', '1.799', '0.1188', '7.000', '0.7079', 1, 1, 1, 1, 1725021451.0914311]