TEST_NAME : Wafer
TEST_DATE : 24_08_30-15_09_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-006-04 | FUSED_ID : 6359364768390762596
  IC_TEMP :  -63.85 | VDDM : 1208.86 | AUX_INT : -900.55 | CsaBias : -642.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.04593e-02 / 2
  ADC_P0  : -9.00555e-01 ± 3.61449e-01
  ADC_P1  : 2.21546e-02 ± 7.05565e-03
  ADC_P2  : -5.39454e-05 ± 2.84622e-05
  CSA_Chi2/NDF : 1.41800e-04 / 2
  CSA_P0  : 5.89960e-02 ± 7.94257e-03
  CSA_P1  : 1.01486e-02 ± 5.98416e-04
  CSA_P2  : -4.91200e-05 ± 9.11316e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 36, 37, 75, 76, 88, 112, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [22, 25, 37, 43, 47, 59, 93, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1461', '1.800', '0.1592', '1.800', '0.0833', '7.000', '0.7078', 1, 1, 1, 1, 1725023382.1290464]
VI_after__Init : ['1.202', '0.1461', '1.800', '0.1591', '1.799', '0.0777', '7.000', '0.7075', 1, 1, 1, 1, 1725023390.9443948]
VI_at__the_End : ['1.202', '0.4998', '1.800', '0.1396', '1.800', '0.1111', '7.000', '0.7082', 1, 1, 1, 1, 1725023449.9209025]