TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_58_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-013-04 | FUSED_ID : 6359364768390762708
  IC_TEMP :  -58.02 | VDDM : 1146.06 | AUX_INT : -256.04 | CsaBias : -125.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.72076e-04 / 2
  ADC_P0  : -2.56043e-01 ± 1.70418e-02
  ADC_P1  : 1.20456e-02 ± 3.74441e-04
  ADC_P2  : -1.90977e-05 ± 1.61983e-06
  CSA_Chi2/NDF : 9.53458e-05 / 2
  CSA_P0  : 5.90868e-02 ± 6.51288e-03
  CSA_P1  : 9.86029e-03 ± 4.90699e-04
  CSA_P2  : -4.58653e-05 ± 7.47276e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [7, 8, 9, 27, 31, 72, 74, 107, 112, 117, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [19, 37, 51, 80, 84, 107, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2507', '1.800', '0.1616', '1.800', '0.0863', '7.000', '0.7082', 1, 1, 1, 1, 1725022717.0036516]
VI_after__Init : ['1.202', '0.2508', '1.800', '0.1616', '1.800', '0.0791', '7.000', '0.7076', 1, 1, 1, 1, 1725022725.2210636]
VI_at__the_End : ['1.202', '0.4929', '1.800', '0.1370', '1.802', '0.1123', '7.000', '0.7084', 1, 1, 1, 1, 1725022792.37588]