TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_53_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-016-03 | FUSED_ID : 6359364768390762755
  IC_TEMP :  -51.57 | VDDM : 1122.08 | AUX_INT :   -6.76 | CsaBias :   87.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07441e-03 / 2
  ADC_P0  : -6.76190e-03 ± 2.22260e-02
  ADC_P1  : 7.87187e-03 ± 5.21749e-04
  ADC_P2  : -4.60318e-06 ± 2.43316e-06
  CSA_Chi2/NDF : 1.20668e-04 / 2
  CSA_P0  : 5.70942e-02 ± 7.32686e-03
  CSA_P1  : 9.80127e-03 ± 5.52026e-04
  CSA_P2  : -4.53295e-05 ± 8.40671e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [16, 25, 48, 71, 80, 87, 95, 103, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [31, 48, 56, 92, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2376', '1.800', '0.1502', '1.800', '0.0830', '7.000', '0.7075', 1, 1, 1, 1, 1725022434.0466464]
VI_after__Init : ['1.202', '0.2377', '1.800', '0.1498', '1.800', '0.0772', '7.000', '0.7075', 1, 1, 1, 1, 1725022442.0391717]
VI_at__the_End : ['1.202', '0.4910', '1.800', '0.1366', '1.799', '0.1103', '7.000', '0.7083', 1, 1, 1, 1, 1725022508.233853]