TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_37_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-015-022-00 | FUSED_ID : 6359364768390771040
  IC_TEMP :  -55.74 | VDDM : 1188.29 | AUX_INT : -1075.11 | CsaBias : -751.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.38493e-02 / 2
  ADC_P0  : -1.07511e+00 ± 4.94704e-01
  ADC_P1  : 2.39399e-02 ± 9.11114e-03
  ADC_P2  : -5.87200e-05 ± 3.50659e-05
  CSA_Chi2/NDF : 1.13544e-04 / 2
  CSA_P0  : 5.93715e-02 ± 7.10729e-03
  CSA_P1  : 9.59090e-03 ± 5.35483e-04
  CSA_P2  : -4.07799e-05 ± 8.15478e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [25, 45, 66, 88, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [17, 28, 37, 78, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2461', '1.800', '0.1177', '1.800', '0.0880', '7.000', '0.7074', 1, 1, 1, 1, 1725259058.7731864]
VI_after__Init : ['1.201', '0.2460', '1.800', '0.1176', '1.801', '0.0827', '7.000', '0.7072', 1, 1, 1, 1, 1725259066.9414825]
VI_at__the_End : ['1.201', '0.4976', '1.800', '0.1372', '1.804', '0.1102', '7.000', '0.7083', 1, 1, 1, 1, 1725259132.545648]