TEST_NAME : Wafer
TEST_DATE : 24_09_02-10_02_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-018-009-12 | FUSED_ID : 6359364768390783132
  IC_TEMP :  -52.21 | VDDM : 1126.52 | AUX_INT :   -7.40 | CsaBias :   68.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04384e-03 / 2
  ADC_P0  : -7.39830e-03 ± 2.18827e-02
  ADC_P1  : 8.47289e-03 ± 5.47683e-04
  ADC_P2  : -5.78981e-06 ± 2.71299e-06
  CSA_Chi2/NDF : 1.16240e-04 / 2
  CSA_P0  : 5.92277e-02 ± 7.19119e-03
  CSA_P1  : 9.70410e-03 ± 5.41804e-04
  CSA_P2  : -4.26308e-05 ± 8.25104e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [34, 38, 53, 64, 82, 83, 89, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [8, 65, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1820', '1.800', '0.1742', '1.799', '0.0887', '7.000', '0.7075', 1, 1, 1, 1, 1725264129.1670423]
VI_after__Init : ['1.202', '0.1820', '1.800', '0.1741', '1.800', '0.0835', '7.000', '0.7071', 1, 1, 1, 1, 1725264137.24852]
VI_at__the_End : ['1.202', '0.4977', '1.800', '0.1374', '1.804', '0.1113', '7.000', '0.7079', 1, 1, 1, 1, 1725264202.7104056]