TEST_NAME : Wafer
TEST_DATE : 24_09_02-10_10_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-018-014-12 | FUSED_ID : 6359364768390783212
  IC_TEMP :  -65.95 | VDDM : 1204.77 | AUX_INT : -751.22 | CsaBias : -521.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86693e-02 / 2
  ADC_P0  : -7.51222e-01 ± 2.56076e-01
  ADC_P1  : 1.96877e-02 ± 5.11718e-03
  ADC_P2  : -4.53664e-05 ± 2.08192e-05
  CSA_Chi2/NDF : 1.07988e-04 / 2
  CSA_P0  : 5.93666e-02 ± 6.93121e-03
  CSA_P1  : 9.57663e-03 ± 5.22217e-04
  CSA_P2  : -4.06748e-05 ± 7.95274e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 11, 15, 29, 58, 80, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [22, 31, 70, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1386', '1.800', '0.1596', '1.799', '0.0880', '7.000', '0.7067', 1, 1, 1, 1, 1725264610.3238463]
VI_after__Init : ['1.202', '0.1386', '1.800', '0.1596', '1.799', '0.0821', '7.000', '0.7067', 1, 1, 1, 1, 1725264618.3662121]
VI_at__the_End : ['1.201', '0.4975', '1.800', '0.1367', '1.800', '0.1096', '7.000', '0.7077', 1, 1, 1, 1, 1725264679.0125415]