TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_16_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-002-010-01 | FUSED_ID : 6359364768391766177
  IC_TEMP :  -90.21 | VDDM : 1104.80 | AUX_INT :  -11.66 | CsaBias :   33.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.98172e-03 / 2
  ADC_P0  : -1.16554e-02 ± 3.01448e-02
  ADC_P1  : 9.14852e-03 ± 7.80573e-04
  ADC_P2  : -7.66840e-06 ± 4.03896e-06
  CSA_Chi2/NDF : 2.34964e-04 / 2
  CSA_P0  : 5.63980e-02 ± 1.02241e-02
  CSA_P1  : 1.02337e-02 ± 7.70309e-04
  CSA_P2  : -6.82054e-05 ± 1.17309e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [29, 38, 50, 61, 90, 94]
 | N_BROKEN_SLOW :  [9, 15, 74, 78, 82, 104]
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3992', '1.800', '0.1348', '1.800', '0.1030', '6.999', '0.7069', 1, 1, 1, 1, 1725282987.7668924]
VI_after__Init : ['1.201', '0.4015', '1.800', '0.1349', '1.801', '0.0967', '7.000', '0.7067', 1, 1, 1, 1, 1725282995.7573674]
VI_at__the_End : ['1.201', '0.4309', '1.800', '0.1351', '1.800', '0.1240', '7.001', '0.7078', 1, 1, 1, 1, 1725283057.635013]