TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_19_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-002-012-01 | FUSED_ID : 6359364768391766209
  IC_TEMP :  -99.76 | VDDM : 1102.78 | AUX_INT :  -11.46 | CsaBias :   54.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.99354e-03 / 2
  ADC_P0  : -1.14569e-02 ± 3.02571e-02
  ADC_P1  : 9.51510e-03 ± 8.19172e-04
  ADC_P2  : -8.13572e-06 ± 4.42909e-06
  CSA_Chi2/NDF : 1.42462e-04 / 2
  CSA_P0  : 5.64213e-02 ± 7.96107e-03
  CSA_P1  : 1.02087e-02 ± 5.99809e-04
  CSA_P2  : -7.12031e-05 ± 9.13438e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 25, 39, 53, 71, 78, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [20, 30, 62, 82, 85, 97, 102, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3109', '1.800', '0.1117', '1.799', '0.1060', '7.000', '0.7069', 1, 1, 1, 1, 1725283179.8592625]
VI_after__Init : ['1.201', '0.3117', '1.800', '0.1120', '1.799', '0.0998', '7.000', '0.7069', 1, 1, 1, 1, 1725283188.0336475]
VI_at__the_End : ['1.184', '0.4054', '1.800', '0.1310', '1.800', '0.1320', '7.000', '0.7072', 1, 1, 1, 1, 1725283257.0066004]