TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_27_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-002-017-06 | FUSED_ID : 6359364768391766294
  IC_TEMP :  -92.02 | VDDM : 1107.13 | AUX_INT :  -14.83 | CsaBias :   41.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.15621e-03 / 2
  ADC_P0  : -1.48317e-02 ± 3.81122e-02
  ADC_P1  : 9.37492e-03 ± 9.98357e-04
  ADC_P2  : -7.88194e-06 ± 5.28400e-06
  CSA_Chi2/NDF : 1.59490e-04 / 2
  CSA_P0  : 5.60918e-02 ± 8.42343e-03
  CSA_P1  : 1.08081e-02 ± 6.34645e-04
  CSA_P2  : -8.11670e-05 ± 9.66489e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [22, 68, 72, 74, 79, 86, 124, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1482', '1.800', '0.1434', '1.800', '0.0989', '7.000', '0.7069', 1, 1, 1, 1, 1725283661.7856798]
VI_after__Init : ['1.201', '0.1484', '1.800', '0.1436', '1.800', '0.0927', '7.000', '0.7067', 1, 1, 1, 1, 1725283670.0691605]
VI_at__the_End : ['1.201', '0.4190', '1.800', '0.1298', '1.814', '0.1323', '7.000', '0.7076', 1, 1, 1, 1, 1725283738.6060395]