TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_29_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-002-018-06 | FUSED_ID : 6359364768391766310
  IC_TEMP : -109.80 | VDDM : 1132.50 | AUX_INT :  -10.52 | CsaBias :   46.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69231e-03 / 2
  ADC_P0  : -1.05178e-02 ± 2.78650e-02
  ADC_P1  : 9.62169e-03 ± 7.68960e-04
  ADC_P2  : -8.14708e-06 ± 4.23087e-06
  CSA_Chi2/NDF : 1.08281e-04 / 2
  CSA_P0  : 5.87819e-02 ± 6.94061e-03
  CSA_P1  : 1.03489e-02 ± 5.22925e-04
  CSA_P2  : -7.61407e-05 ± 7.96353e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [24, 45, 70, 97, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 36, 44, 50, 78, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3145', '1.800', '0.1076', '1.799', '0.1072', '7.000', '0.7076', 1, 1, 1, 1, 1725283758.1195507]
VI_after__Init : ['1.201', '0.3154', '1.800', '0.1079', '1.800', '0.1001', '7.000', '0.7069', 1, 1, 1, 1, 1725283766.1739736]
VI_at__the_End : ['1.201', '0.4078', '1.800', '0.1291', '1.800', '0.1366', '7.000', '0.7073', 1, 1, 1, 1, 1725283826.22855]