TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_30_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-002-019-06 | FUSED_ID : 6359364768391766326
  IC_TEMP :  -97.25 | VDDM : 1112.87 | AUX_INT :  -73.08 | CsaBias :   -4.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.75875e-03 / 2
  ADC_P0  : -7.30835e-02 ± 3.99749e-02
  ADC_P1  : 9.93651e-03 ± 9.99478e-04
  ADC_P2  : -1.04670e-05 ± 4.97697e-06
  CSA_Chi2/NDF : 1.34211e-04 / 2
  CSA_P0  : 5.54134e-02 ± 7.72709e-03
  CSA_P1  : 1.00179e-02 ± 5.82181e-04
  CSA_P2  : -6.88350e-05 ± 8.86592e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [50, 86, 91]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [8, 27]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1596', '1.800', '0.1478', '1.800', '0.0938', '7.000', '0.7070', 1, 1, 1, 1, 1725283854.0384183]
VI_after__Init : ['1.201', '0.1599', '1.800', '0.1478', '1.800', '0.0876', '7.000', '0.7065', 1, 1, 1, 1, 1725283862.2358348]
VI_at__the_End : ['1.201', '0.4105', '1.800', '0.1260', '1.804', '0.1315', '7.000', '0.7079', 1, 1, 1, 1, 1725283928.4778156]