TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_54_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-003-008-12 | FUSED_ID : 6359364768391770252
  IC_TEMP :  -74.08 | VDDM : 1100.15 | AUX_INT :   -9.28 | CsaBias :   75.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52522e-03 / 2
  ADC_P0  : -9.28339e-03 ± 2.64106e-02
  ADC_P1  : 8.52855e-03 ± 6.41196e-04
  ADC_P2  : -6.67631e-06 ± 3.10014e-06
  CSA_Chi2/NDF : 2.09417e-04 / 2
  CSA_P0  : 5.56160e-02 ± 9.65224e-03
  CSA_P1  : 1.02800e-02 ± 7.27226e-04
  CSA_P2  : -5.96065e-05 ± 1.10748e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [19, 53, 85, 98, 100, 101, 105, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [2, 8, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3176', '1.800', '0.1152', '1.800', '0.0432', '7.000', '0.7058', 1, 1, 1, 1, 1725285292.2404263]
VI_after__Init : ['1.202', '0.3170', '1.800', '0.1153', '1.800', '0.0950', '7.000', '0.7076', 1, 1, 1, 1, 1725285300.4087079]
VI_at__the_End : ['1.202', '0.4618', '1.800', '0.1351', '1.799', '0.1242', '7.000', '0.7084', 1, 1, 1, 1, 1725285361.2546897]