TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_51_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-003-010-12 | FUSED_ID : 6359364768391770284
  IC_TEMP :  -76.82 | VDDM : 1112.98 | AUX_INT :  -11.04 | CsaBias :   66.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78950e-03 / 2
  ADC_P0  : -1.10439e-02 ± 2.86290e-02
  ADC_P1  : 8.62532e-03 ± 6.97460e-04
  ADC_P2  : -6.96323e-06 ± 3.38768e-06
  CSA_Chi2/NDF : 1.85151e-04 / 2
  CSA_P0  : 5.69901e-02 ± 9.07581e-03
  CSA_P1  : 9.88981e-03 ± 6.83797e-04
  CSA_P2  : -5.57169e-05 ± 1.04134e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 12, 50, 95, 98, 103, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [3, 4, 33, 37, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3314', '1.800', '0.1468', '1.800', '0.0943', '7.000', '0.7076', 1, 1, 1, 1, 1725285105.584145]
VI_after__Init : ['1.202', '0.3318', '1.800', '0.1471', '1.800', '0.0891', '7.000', '0.7078', 1, 1, 1, 1, 1725285113.7405035]
VI_at__the_End : ['1.202', '0.4514', '1.800', '0.1312', '1.802', '0.1242', '7.000', '0.7085', 1, 1, 1, 1, 1725285180.199775]