TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_50_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-003-011-12 | FUSED_ID : 6359364768391770300
  IC_TEMP :  -74.95 | VDDM : 1120.12 | AUX_INT :   -9.36 | CsaBias :   51.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39382e-03 / 2
  ADC_P0  : -9.36253e-03 ± 2.52837e-02
  ADC_P1  : 8.81175e-03 ± 6.43590e-04
  ADC_P2  : -6.72295e-06 ± 3.25785e-06
  CSA_Chi2/NDF : 2.17298e-04 / 2
  CSA_P0  : 5.52323e-02 ± 9.83218e-03
  CSA_P1  : 1.00431e-02 ± 7.40784e-04
  CSA_P2  : -5.82705e-05 ± 1.12813e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [48, 55, 57, 66, 76, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [27, 33, 34, 53, 72, 73, 83, 110, 116, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2478', '1.800', '0.1377', '1.800', '0.0985', '7.000', '0.7079', 1, 1, 1, 1, 1725285008.9775784]
VI_after__Init : ['1.202', '0.2479', '1.800', '0.1377', '1.800', '0.0928', '7.000', '0.7077', 1, 1, 1, 1, 1725285017.151773]
VI_at__the_End : ['1.202', '0.4523', '1.800', '0.1347', '1.799', '0.1250', '7.000', '0.7086', 1, 1, 1, 1, 1725285077.692509]