TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_46_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-003-013-12 | FUSED_ID : 6359364768391770332
  IC_TEMP :  -71.78 | VDDM : 1117.98 | AUX_INT :  -82.18 | CsaBias :   -3.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.90015e-03 / 2
  ADC_P0  : -8.21788e-02 ± 4.19722e-02
  ADC_P1  : 9.93699e-03 ± 1.05060e-03
  ADC_P2  : -1.01082e-05 ± 5.22778e-06
  CSA_Chi2/NDF : 1.55004e-04 / 2
  CSA_P0  : 5.95143e-02 ± 8.30412e-03
  CSA_P1  : 9.98297e-03 ± 6.25656e-04
  CSA_P2  : -5.80648e-05 ± 9.52799e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [30, 50, 66, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [9, 16, 63, 77, 91, 104, 107, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1521', '1.800', '0.1370', '1.800', '0.0874', '7.000', '0.7079', 1, 1, 1, 1, 1725284816.9206407]
VI_after__Init : ['1.201', '0.1523', '1.800', '0.1371', '1.800', '0.0816', '7.000', '0.7076', 1, 1, 1, 1, 1725284824.9499426]
VI_at__the_End : ['1.201', '0.4538', '1.800', '0.1328', '1.800', '0.1252', '7.000', '0.7086', 1, 1, 1, 1, 1725284884.1955774]