TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_38_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-003-018-11 | FUSED_ID : 6359364768391770411
  IC_TEMP :  -93.20 | VDDM : 1118.51 | AUX_INT :  -10.51 | CsaBias :   44.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53333e-03 / 2
  ADC_P0  : -1.05108e-02 ± 2.64611e-02
  ADC_P1  : 9.20882e-03 ± 6.91169e-04
  ADC_P2  : -7.81552e-06 ± 3.60011e-06
  CSA_Chi2/NDF : 1.75978e-04 / 2
  CSA_P0  : 5.90274e-02 ± 8.84814e-03
  CSA_P1  : 1.03224e-02 ± 6.66643e-04
  CSA_P2  : -6.97735e-05 ± 1.01522e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 60, 103, 117, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 19, 27, 30, 52, 60, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1599', '1.800', '0.1485', '1.800', '0.0961', '7.000', '0.7073', 1, 1, 1, 1, 1725284335.5031426]
VI_after__Init : ['1.202', '0.1600', '1.800', '0.1485', '1.800', '0.0901', '7.000', '0.7073', 1, 1, 1, 1, 1725284344.3135104]
VI_at__the_End : ['1.201', '0.4279', '1.800', '0.1300', '1.799', '0.1306', '7.000', '0.7083', 1, 1, 1, 1, 1725284410.9565027]