TEST_NAME : Wafer
TEST_DATE : 24_09_02-15_34_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-003-021-11 | FUSED_ID : 6359364768391770459
  IC_TEMP :  -84.41 | VDDM : 1120.74 | AUX_INT :  -10.01 | CsaBias :   53.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55024e-03 / 2
  ADC_P0  : -1.00134e-02 ± 2.66717e-02
  ADC_P1  : 9.18167e-03 ± 7.07542e-04
  ADC_P2  : -7.15777e-06 ± 3.74209e-06
  CSA_Chi2/NDF : 1.78210e-04 / 2
  CSA_P0  : 5.89925e-02 ± 8.90407e-03
  CSA_P1  : 1.11002e-02 ± 6.70857e-04
  CSA_P2  : -7.57312e-05 ± 1.02164e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [108, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [15, 80, 84, 104, 113, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2442', '1.800', '0.1263', '1.800', '0.0959', '7.000', '0.7072', 1, 1, 1, 1, 1725284046.6889951]
VI_after__Init : ['1.202', '0.2444', '1.800', '0.1265', '1.800', '0.0904', '7.000', '0.7070', 1, 1, 1, 1, 1725284054.9713085]
VI_at__the_End : ['1.202', '0.4516', '1.800', '0.1365', '1.800', '0.1275', '7.000', '0.7079', 1, 1, 1, 1, 1725284121.7212653]