TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_02_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-004-009-04 | FUSED_ID : 6359364768391774356
  IC_TEMP :  -71.23 | VDDM : 1117.12 | AUX_INT :   -7.63 | CsaBias :   59.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01946e-03 / 2
  ADC_P0  : -7.62901e-03 ± 2.16325e-02
  ADC_P1  : 8.46199e-03 ± 5.43235e-04
  ADC_P2  : -5.51472e-06 ± 2.70639e-06
  CSA_Chi2/NDF : 1.87845e-04 / 2
  CSA_P0  : 5.92126e-02 ± 9.14160e-03
  CSA_P1  : 1.02409e-02 ± 6.88753e-04
  CSA_P2  : -5.85673e-05 ± 1.04889e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [39, 45, 46]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [14, 24, 67, 74, 77, 92, 96, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3954', '1.800', '0.1363', '1.800', '0.1099', '7.000', '0.7079', 1, 1, 1, 1, 1725285773.82829]
VI_after__Init : ['1.202', '0.3958', '1.800', '0.1369', '1.800', '0.1022', '7.000', '0.7070', 1, 1, 1, 1, 1725285781.8216486]
VI_at__the_End : ['1.202', '0.4677', '1.800', '0.1374', '1.800', '0.1223', '7.000', '0.7078', 1, 1, 1, 1, 1725285848.5422766]