TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_07_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-004-012-04 | FUSED_ID : 6359364768391774404
  IC_TEMP :  -74.73 | VDDM : 1105.85 | AUX_INT :   -8.33 | CsaBias :   52.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40093e-03 / 2
  ADC_P0  : -8.33399e-03 ± 2.53481e-02
  ADC_P1  : 8.78922e-03 ± 6.45230e-04
  ADC_P2  : -6.63983e-06 ± 3.26615e-06
  CSA_Chi2/NDF : 1.86144e-04 / 2
  CSA_P0  : 5.87236e-02 ± 9.10012e-03
  CSA_P1  : 1.02299e-02 ± 6.85628e-04
  CSA_P2  : -6.10981e-05 ± 1.04413e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [21, 29, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [49, 54, 58, 59, 89, 91, 101, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2652', '1.800', '0.1608', '1.800', '0.1015', '7.000', '0.7072', 1, 1, 1, 1, 1725286062.1233287]
VI_after__Init : ['1.202', '0.2643', '1.800', '0.1615', '1.800', '0.0944', '7.000', '0.7072', 1, 1, 1, 1, 1725286070.1046755]
VI_at__the_End : ['1.201', '0.4545', '1.800', '0.1357', '1.800', '0.1224', '7.000', '0.7075', 1, 1, 1, 1, 1725286135.6396034]