TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_09_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-004-013-04 | FUSED_ID : 6359364768391774420
  IC_TEMP :  -69.93 | VDDM : 1112.14 | AUX_INT :   -8.22 | CsaBias :   61.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32373e-03 / 2
  ADC_P0  : -8.22268e-03 ± 2.46707e-02
  ADC_P1  : 8.71706e-03 ± 6.32958e-04
  ADC_P2  : -6.17040e-06 ± 3.21659e-06
  CSA_Chi2/NDF : 2.00288e-04 / 2
  CSA_P0  : 5.67501e-02 ± 9.43952e-03
  CSA_P1  : 1.01183e-02 ± 7.11200e-04
  CSA_P2  : -5.86600e-05 ± 1.08307e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 35, 68, 97, 98, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [64, 65, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3109', '1.800', '0.1303', '1.800', '0.0946', '7.000', '0.7079', 1, 1, 1, 1, 1725286157.9368424]
VI_after__Init : ['1.202', '0.3111', '1.800', '0.1304', '1.800', '0.0868', '7.000', '0.7069', 1, 1, 1, 1, 1725286165.9942489]
VI_at__the_End : ['1.202', '0.4525', '1.800', '0.1330', '1.801', '0.1230', '7.000', '0.7078', 1, 1, 1, 1, 1725286232.46398]