TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_57_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-005-006-09 | FUSED_ID : 6359364768391778409
  IC_TEMP :  -61.01 | VDDM : 1117.85 | AUX_INT :  -11.70 | CsaBias :   70.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.17163e-03 / 2
  ADC_P0  : -1.16972e-02 ± 3.16516e-02
  ADC_P1  : 8.31329e-03 ± 7.62335e-04
  ADC_P2  : -5.51559e-06 ± 3.68180e-06
  CSA_Chi2/NDF : 1.57120e-04 / 2
  CSA_P0  : 5.81994e-02 ± 8.36061e-03
  CSA_P1  : 9.85003e-03 ± 6.29912e-04
  CSA_P2  : -5.00928e-05 ± 9.59281e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [10, 16, 30, 71, 113, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [21, 33, 53, 54, 85, 102, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3601', '1.800', '0.1278', '1.800', '0.0899', '7.000', '0.7079', 1, 1, 1, 1, 1725289047.6866164]
VI_after__Init : ['1.201', '0.3603', '1.800', '0.1279', '1.800', '0.0859', '7.000', '0.7070', 1, 1, 1, 1, 1725289055.7248046]
VI_at__the_End : ['1.201', '0.4756', '1.800', '0.1347', '1.800', '0.1184', '7.000', '0.7079', 1, 1, 1, 1, 1725289115.7714396]