TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_47_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-005-012-09 | FUSED_ID : 6359364768391778505
  IC_TEMP :  -60.85 | VDDM : 1122.29 | AUX_INT :  -10.99 | CsaBias :   64.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93559e-03 / 2
  ADC_P0  : -1.09910e-02 ± 2.98313e-02
  ADC_P1  : 8.44951e-03 ± 7.22266e-04
  ADC_P2  : -6.25380e-06 ± 3.48707e-06
  CSA_Chi2/NDF : 1.47986e-04 / 2
  CSA_P0  : 5.81978e-02 ± 8.11396e-03
  CSA_P1  : 9.49953e-03 ± 6.11328e-04
  CSA_P2  : -4.55997e-05 ± 9.30981e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [38, 46, 63, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [19, 22, 50, 58]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2122', '1.800', '0.1540', '1.800', '0.0945', '7.000', '0.7076', 1, 1, 1, 1, 1725288469.4771278]
VI_after__Init : ['1.202', '0.2123', '1.800', '0.1539', '1.800', '0.0885', '7.000', '0.7078', 1, 1, 1, 1, 1725288477.5134835]
VI_at__the_End : ['1.202', '0.4714', '1.800', '0.1361', '1.800', '0.1174', '7.000', '0.7082', 1, 1, 1, 1, 1725288537.5640225]