TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_46_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-005-013-09 | FUSED_ID : 6359364768391778521
  IC_TEMP :  -59.60 | VDDM : 1126.87 | AUX_INT :   -7.50 | CsaBias :   68.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04639e-03 / 2
  ADC_P0  : -7.50407e-03 ± 2.19094e-02
  ADC_P1  : 8.47787e-03 ± 5.48353e-04
  ADC_P2  : -5.80293e-06 ± 2.71631e-06
  CSA_Chi2/NDF : 1.99697e-04 / 2
  CSA_P0  : 5.76920e-02 ± 9.42558e-03
  CSA_P1  : 1.04465e-02 ± 7.10149e-04
  CSA_P2  : -5.63025e-05 ± 1.08147e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [22, 38, 55, 94, 95, 119, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [11, 55, 64, 67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4182', '1.800', '0.1513', '1.800', '0.0962', '7.000', '0.7076', 1, 1, 1, 1, 1725288372.702371]
VI_after__Init : ['1.201', '0.4185', '1.800', '0.1516', '1.799', '0.0902', '7.000', '0.7077', 1, 1, 1, 1, 1725288380.7167604]
VI_at__the_End : ['1.202', '0.4866', '1.800', '0.1395', '1.800', '0.1169', '7.000', '0.7083', 1, 1, 1, 1, 1725288447.5726476]