TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_39_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-005-017-14 | FUSED_ID : 6359364768391778590
  IC_TEMP :  -60.96 | VDDM : 1120.33 | AUX_INT :   -8.69 | CsaBias :   69.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18010e-03 / 2
  ADC_P0  : -8.69318e-03 ± 2.32464e-02
  ADC_P1  : 8.72018e-03 ± 5.89634e-04
  ADC_P2  : -6.43991e-06 ± 2.97044e-06
  CSA_Chi2/NDF : 1.74788e-04 / 2
  CSA_P0  : 5.91764e-02 ± 8.81817e-03
  CSA_P1  : 1.03440e-02 ± 6.64386e-04
  CSA_P2  : -5.52742e-05 ± 1.01178e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [0, 18, 57, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [36, 47, 58, 60, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3958', '1.800', '0.1777', '1.800', '0.0926', '7.000', '0.7075', 1, 1, 1, 1, 1725287987.4708452]
VI_after__Init : ['1.201', '0.3958', '1.800', '0.1778', '1.800', '0.0872', '7.000', '0.7075', 1, 1, 1, 1, 1725287996.3742526]
VI_at__the_End : ['1.202', '0.4868', '1.800', '0.1398', '1.800', '0.1162', '7.000', '0.7084', 1, 1, 1, 1, 1725288062.474366]