TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_38_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-005-018-14 | FUSED_ID : 6359364768391778606
  IC_TEMP :  -74.76 | VDDM : 1119.92 | AUX_INT :   -9.57 | CsaBias :   60.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45175e-03 / 2
  ADC_P0  : -9.57420e-03 ± 2.58038e-02
  ADC_P1  : 8.80575e-03 ± 6.56828e-04
  ADC_P2  : -6.68081e-06 ± 3.32486e-06
  CSA_Chi2/NDF : 1.84152e-04 / 2
  CSA_P0  : 5.96504e-02 ± 9.05130e-03
  CSA_P1  : 1.04166e-02 ± 6.81950e-04
  CSA_P2  : -6.29397e-05 ± 1.03853e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [24, 34, 38, 45, 53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [3, 10, 16, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2320', '1.800', '0.1282', '1.800', '0.0954', '7.000', '0.7074', 1, 1, 1, 1, 1725287891.7878723]
VI_after__Init : ['1.202', '0.2323', '1.800', '0.1282', '1.800', '0.0896', '7.000', '0.7073', 1, 1, 1, 1, 1725287899.7872612]
VI_at__the_End : ['1.201', '0.4582', '1.800', '0.1355', '1.800', '0.1217', '7.000', '0.7081', 1, 1, 1, 1, 1725287968.0172796]