TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_33_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-005-021-14 | FUSED_ID : 6359364768391778654
  IC_TEMP :  -66.92 | VDDM : 1104.89 | AUX_INT :   -8.96 | CsaBias :   60.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27161e-03 / 2
  ADC_P0  : -8.95921e-03 ± 2.40961e-02
  ADC_P1  : 8.79511e-03 ± 6.03841e-04
  ADC_P2  : -7.36156e-06 ± 2.99292e-06
  CSA_Chi2/NDF : 1.95361e-04 / 2
  CSA_P0  : 5.80553e-02 ± 9.32270e-03
  CSA_P1  : 1.02455e-02 ± 7.02398e-04
  CSA_P2  : -5.58862e-05 ± 1.06967e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 20, 27, 30, 44, 62, 94, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 5, 21, 22, 52, 83, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4020', '1.800', '0.1531', '1.800', '0.0982', '7.000', '0.7071', 1, 1, 1, 1, 1725287602.4898403]
VI_after__Init : ['1.202', '0.4026', '1.800', '0.1537', '1.800', '0.0923', '7.000', '0.7074', 1, 1, 1, 1, 1725287611.3092105]
VI_at__the_End : ['1.202', '0.4769', '1.800', '0.1356', '1.800', '0.1193', '7.000', '0.7079', 1, 1, 1, 1, 1725287678.7003474]