TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_31_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-005-022-14 | FUSED_ID : 6359364768391778670
  IC_TEMP :  -66.24 | VDDM : 1130.98 | AUX_INT :   -6.66 | CsaBias :   53.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08284e-03 / 2
  ADC_P0  : -6.66215e-03 ± 2.23062e-02
  ADC_P1  : 8.59986e-03 ± 5.71483e-04
  ADC_P2  : -5.85576e-06 ± 2.88714e-06
  CSA_Chi2/NDF : 1.89285e-04 / 2
  CSA_P0  : 5.95800e-02 ± 9.17656e-03
  CSA_P1  : 1.02652e-02 ± 6.91388e-04
  CSA_P2  : -5.57875e-05 ± 1.05290e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [28]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [36, 40, 51, 75, 87, 91, 101, 107, 112, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2463', '1.800', '0.1637', '1.800', '0.0894', '7.000', '0.7072', 1, 1, 1, 1, 1725287506.1597216]
VI_after__Init : ['1.201', '0.2464', '1.800', '0.1637', '1.800', '0.0834', '7.000', '0.7070', 1, 1, 1, 1, 1725287514.8740814]
VI_at__the_End : ['1.201', '0.4802', '1.800', '0.1374', '1.800', '0.1196', '7.000', '0.7080', 1, 1, 1, 1, 1725287581.7902894]