TEST_NAME : Wafer
TEST_DATE : 24_09_02-16_30_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-005-023-14 | FUSED_ID : 6359364768391778686
  IC_TEMP :  -69.03 | VDDM : 1119.91 | AUX_INT :   -8.59 | CsaBias :   62.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08657e-03 / 2
  ADC_P0  : -8.59110e-03 ± 2.22528e-02
  ADC_P1  : 8.90743e-03 ± 5.66242e-04
  ADC_P2  : -7.43490e-06 ± 2.85427e-06
  CSA_Chi2/NDF : 2.20688e-04 / 2
  CSA_P0  : 5.45220e-02 ± 9.90859e-03
  CSA_P1  : 1.03272e-02 ± 7.46541e-04
  CSA_P2  : -5.83390e-05 ± 1.13689e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [35, 46, 76, 117, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [28, 45, 62, 66, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3182', '1.800', '0.1192', '1.799', '0.0949', '7.000', '0.7069', 1, 1, 1, 1, 1725287409.4105518]
VI_after__Init : ['1.202', '0.3186', '1.800', '0.1195', '1.800', '0.0889', '7.000', '0.7068', 1, 1, 1, 1, 1725287418.3489418]
VI_at__the_End : ['1.201', '0.4685', '1.800', '0.1321', '1.800', '0.1226', '7.000', '0.7079', 1, 1, 1, 1, 1725287483.7572887]