TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_05_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-005-07 | FUSED_ID : 6359364768391782487
  IC_TEMP :  -63.95 | VDDM : 1119.61 | AUX_INT :   -8.37 | CsaBias :   60.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24914e-03 / 2
  ADC_P0  : -8.37282e-03 ± 2.39807e-02
  ADC_P1  : 8.67755e-03 ± 6.19495e-04
  ADC_P2  : -5.52119e-06 ± 3.18548e-06
  CSA_Chi2/NDF : 2.45455e-04 / 2
  CSA_P0  : 5.96626e-02 ± 1.04498e-02
  CSA_P1  : 1.05319e-02 ± 7.87318e-04
  CSA_P2  : -5.92726e-05 ± 1.19899e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [22, 31, 67, 69, 73, 98, 115, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [16, 22, 40, 47, 70, 78, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4604', '1.800', '0.1594', '1.800', '0.1019', '7.000', '0.7068', 1, 1, 1, 1, 1725289523.6668317]
VI_after__Init : ['1.202', '0.4602', '1.800', '0.1596', '1.800', '0.0953', '7.000', '0.7070', 1, 1, 1, 1, 1725289531.676123]
VI_at__the_End : ['1.202', '0.4844', '1.800', '0.1394', '1.800', '0.1165', '7.000', '0.7076', 1, 1, 1, 1, 1725289598.6916678]