TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_07_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-006-07 | FUSED_ID : 6359364768391782503
  IC_TEMP :  -63.49 | VDDM : 1126.42 | AUX_INT :   -7.35 | CsaBias :   61.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05905e-03 / 2
  ADC_P0  : -7.35315e-03 ± 2.20494e-02
  ADC_P1  : 8.63245e-03 ± 5.63691e-04
  ADC_P2  : -5.93760e-06 ± 2.85077e-06
  CSA_Chi2/NDF : 1.68670e-04 / 2
  CSA_P0  : 5.94901e-02 ± 8.66247e-03
  CSA_P1  : 1.00860e-02 ± 6.52654e-04
  CSA_P2  : -5.15321e-05 ± 9.93915e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [14, 27, 31, 47, 63, 113, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [28, 44, 50, 64, 116, 117, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3869', '1.800', '0.1812', '1.800', '0.1024', '7.000', '0.7068', 1, 1, 1, 1, 1725289619.4639869]
VI_after__Init : ['1.202', '0.3872', '1.800', '0.1815', '1.800', '0.0964', '7.000', '0.7067', 1, 1, 1, 1, 1725289628.2843175]
VI_at__the_End : ['1.202', '0.4851', '1.800', '0.1407', '1.800', '0.1169', '7.000', '0.7076', 1, 1, 1, 1, 1725289692.3291218]