TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_08_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-007-07 | FUSED_ID : 6359364768391782519
  IC_TEMP :  -59.47 | VDDM : 1114.17 | AUX_INT :   -9.70 | CsaBias :   74.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43431e-03 / 2
  ADC_P0  : -9.70466e-03 ± 2.56308e-02
  ADC_P1  : 8.48553e-03 ± 6.25652e-04
  ADC_P2  : -6.32720e-06 ± 3.03935e-06
  CSA_Chi2/NDF : 1.56251e-04 / 2
  CSA_P0  : 5.79679e-02 ± 8.33747e-03
  CSA_P1  : 9.69785e-03 ± 6.28168e-04
  CSA_P2  : -4.61933e-05 ± 9.56626e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [15, 19, 23, 32, 95, 103, 105, 116, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [25, 33, 49, 56, 59, 75, 91, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3492', '1.800', '0.1580', '1.800', '0.0973', '7.000', '0.7067', 1, 1, 1, 1, 1725289715.7411444]
VI_after__Init : ['1.202', '0.3494', '1.800', '0.1577', '1.800', '0.0926', '7.000', '0.7069', 1, 1, 1, 1, 1725289723.717511]
VI_at__the_End : ['1.201', '0.4819', '1.800', '0.1373', '1.800', '0.1164', '7.000', '0.7075', 1, 1, 1, 1, 1725289787.2524316]