TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_10_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-008-07 | FUSED_ID : 6359364768391782535
  IC_TEMP :  -57.23 | VDDM : 1125.79 | AUX_INT :   -9.32 | CsaBias :   67.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26933e-03 / 2
  ADC_P0  : -9.31986e-03 ± 2.40826e-02
  ADC_P1  : 8.60742e-03 ± 5.94794e-04
  ADC_P2  : -6.63914e-06 ± 2.92106e-06
  CSA_Chi2/NDF : 1.36263e-04 / 2
  CSA_P0  : 5.86109e-02 ± 7.78595e-03
  CSA_P1  : 9.80267e-03 ± 5.86615e-04
  CSA_P2  : -4.69323e-05 ± 8.93345e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 14, 29, 57, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [6, 44, 57, 73, 85, 95, 96, 105, 110, 112, 113, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2120', '1.800', '0.1227', '1.800', '0.0881', '7.000', '0.7067', 1, 1, 1, 1, 1725289811.6224225]
VI_after__Init : ['1.202', '0.2121', '1.800', '0.1227', '1.800', '0.0827', '7.000', '0.7069', 1, 1, 1, 1, 1725289820.4507616]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1380', '1.800', '0.1152', '7.000', '0.7076', 1, 1, 1, 1, 1725289889.4372194]