TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_13_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-010-07 | FUSED_ID : 6359364768391782567
  IC_TEMP :  -61.43 | VDDM : 1126.33 | AUX_INT :  -10.55 | CsaBias :   66.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60156e-03 / 2
  ADC_P0  : -1.05454e-02 ± 2.70898e-02
  ADC_P1  : 8.66766e-03 ± 6.75742e-04
  ADC_P2  : -6.35236e-06 ± 3.37215e-06
  CSA_Chi2/NDF : 1.74784e-04 / 2
  CSA_P0  : 5.96108e-02 ± 8.81805e-03
  CSA_P1  : 1.03368e-02 ± 6.64377e-04
  CSA_P2  : -5.49192e-05 ± 1.01177e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [27, 49, 79, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [39, 53, 74, 76, 88, 117, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1872', '1.800', '0.1425', '1.799', '0.0858', '7.000', '0.7066', 1, 1, 1, 1, 1725290004.8451035]
VI_after__Init : ['1.202', '0.1872', '1.800', '0.1425', '1.800', '0.0800', '7.000', '0.7068', 1, 1, 1, 1, 1725290013.0664377]
VI_at__the_End : ['1.201', '0.4882', '1.800', '0.1380', '1.800', '0.1160', '7.000', '0.7073', 1, 1, 1, 1, 1725290081.2550795]