TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_15_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-011-07 | FUSED_ID : 6359364768391782583
  IC_TEMP :  -57.67 | VDDM : 1126.48 | AUX_INT :   -8.19 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40509e-03 / 2
  ADC_P0  : -8.18649e-03 ± 2.54641e-02
  ADC_P1  : 8.36784e-03 ± 6.37482e-04
  ADC_P2  : -5.05123e-06 ± 3.17071e-06
  CSA_Chi2/NDF : 1.47881e-04 / 2
  CSA_P0  : 6.03468e-02 ± 8.11109e-03
  CSA_P1  : 1.01640e-02 ± 6.11112e-04
  CSA_P2  : -5.23771e-05 ± 9.30651e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 6, 23, 47, 59, 85, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [12, 24, 25, 26, 59, 76, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2027', '1.800', '0.1718', '1.800', '0.0866', '7.000', '0.7067', 1, 1, 1, 1, 1725290100.6995327]
VI_after__Init : ['1.201', '0.2026', '1.800', '0.1718', '1.802', '0.0808', '7.000', '0.7066', 1, 1, 1, 1, 1725290108.834942]
VI_at__the_End : ['1.202', '0.4879', '1.800', '0.1378', '1.808', '0.1156', '7.000', '0.7074', 1, 1, 1, 1, 1725290178.3914676]