TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_16_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-012-07 | FUSED_ID : 6359364768391782599
  IC_TEMP :  -55.61 | VDDM : 1133.86 | AUX_INT :  -57.53 | CsaBias :   35.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74437e-03 / 2
  ADC_P0  : -5.75280e-02 ± 3.10669e-02
  ADC_P1  : 9.41482e-03 ± 7.68896e-04
  ADC_P2  : -8.91271e-06 ± 3.76723e-06
  CSA_Chi2/NDF : 1.78589e-04 / 2
  CSA_P0  : 5.78075e-02 ± 8.91354e-03
  CSA_P1  : 1.02538e-02 ± 6.71571e-04
  CSA_P2  : -5.25341e-05 ± 1.02272e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [9, 37, 41, 84, 88, 108, 119, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [17, 32, 40, 51, 62]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3176', '1.800', '0.1182', '1.799', '0.0892', '7.000', '0.7069', 1, 1, 1, 1, 1725290197.8939574]
VI_after__Init : ['1.202', '0.3179', '1.800', '0.1182', '1.800', '0.0835', '7.000', '0.7068', 1, 1, 1, 1, 1725290206.009255]
VI_at__the_End : ['1.201', '0.4906', '1.800', '0.1393', '1.805', '0.1153', '7.000', '0.7076', 1, 1, 1, 1, 1725290266.4054425]