TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_18_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-013-07 | FUSED_ID : 6359364768391782615
  IC_TEMP :  -54.15 | VDDM : 1125.33 | AUX_INT :   -8.90 | CsaBias :   73.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44436e-03 / 2
  ADC_P0  : -8.89921e-03 ± 2.57885e-02
  ADC_P1  : 8.27115e-03 ± 6.28948e-04
  ADC_P2  : -5.32323e-06 ± 3.05095e-06
  CSA_Chi2/NDF : 1.36444e-04 / 2
  CSA_P0  : 6.14347e-02 ± 7.79113e-03
  CSA_P1  : 1.00562e-02 ± 5.87005e-04
  CSA_P2  : -4.91216e-05 ± 8.93939e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [18, 34, 46, 51, 64, 66, 94, 112, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 9, 22, 29, 54, 58, 76, 88]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1403', '1.800', '0.1346', '1.800', '0.0812', '7.000', '0.7069', 1, 1, 1, 1, 1725290294.069334]
VI_after__Init : ['1.201', '0.1403', '1.800', '0.1346', '1.802', '0.0760', '7.000', '0.7069', 1, 1, 1, 1, 1725290302.182809]
VI_at__the_End : ['1.201', '0.4960', '1.800', '0.1389', '1.799', '0.1122', '7.000', '0.7080', 1, 1, 1, 1, 1725290361.4230547]