TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_23_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-016-00 | FUSED_ID : 6359364768391782656
  IC_TEMP :  -59.66 | VDDM : 1126.07 | AUX_INT :   -7.25 | CsaBias :   69.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05886e-03 / 2
  ADC_P0  : -7.24843e-03 ± 2.20475e-02
  ADC_P1  : 8.62744e-03 ± 5.63641e-04
  ADC_P2  : -5.92438e-06 ± 2.85052e-06
  CSA_Chi2/NDF : 1.51540e-04 / 2
  CSA_P0  : 5.81361e-02 ± 8.21081e-03
  CSA_P1  : 9.94070e-03 ± 6.18626e-04
  CSA_P2  : -5.01061e-05 ± 9.42093e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [10, 42, 86, 101, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 17, 30, 32, 33]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1513', '1.800', '0.1646', '1.800', '0.0864', '7.000', '0.7071', 1, 1, 1, 1, 1725290583.0089254]
VI_after__Init : ['1.201', '0.1513', '1.800', '0.1645', '1.800', '0.0807', '7.000', '0.7073', 1, 1, 1, 1, 1725290591.8811355]
VI_at__the_End : ['1.202', '0.4815', '1.800', '0.1358', '1.799', '0.1159', '7.000', '0.7079', 1, 1, 1, 1, 1725290658.0009716]