TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_29_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-020-00 | FUSED_ID : 6359364768391782720
  IC_TEMP :  -63.63 | VDDM : 1127.59 | AUX_INT :   -8.72 | CsaBias :   70.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36382e-03 / 2
  ADC_P0  : -8.71727e-03 ± 2.50392e-02
  ADC_P1  : 8.91218e-03 ± 6.55053e-04
  ADC_P2  : -6.40839e-06 ± 3.40394e-06
  CSA_Chi2/NDF : 1.58710e-04 / 2
  CSA_P0  : 6.07606e-02 ± 8.40281e-03
  CSA_P1  : 1.03816e-02 ± 6.33091e-04
  CSA_P2  : -5.65305e-05 ± 9.64122e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 66, 82, 92, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 9, 29, 59, 63, 69, 74, 83, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3208', '1.800', '0.1587', '1.799', '0.0950', '7.000', '0.7077', 1, 1, 1, 1, 1725290968.4329746]
VI_after__Init : ['1.201', '0.3210', '1.800', '0.1589', '1.800', '0.0894', '7.000', '0.7075', 1, 1, 1, 1, 1725290976.5285144]
VI_at__the_End : ['1.202', '0.4850', '1.800', '0.1398', '1.799', '0.1187', '7.000', '0.7083', 1, 1, 1, 1, 1725291043.4451087]