TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_31_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-006-021-00 | FUSED_ID : 6359364768391782736
  IC_TEMP :  -57.58 | VDDM : 1128.87 | AUX_INT :   -5.08 | CsaBias :   60.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.91155e-04 / 2
  ADC_P0  : -5.08011e-03 ± 1.64550e-02
  ADC_P1  : 8.26388e-03 ± 4.11284e-04
  ADC_P2  : -4.99540e-06 ± 2.02770e-06
  CSA_Chi2/NDF : 1.76722e-04 / 2
  CSA_P0  : 5.83013e-02 ± 8.86681e-03
  CSA_P1  : 1.03209e-02 ± 6.68050e-04
  CSA_P2  : -5.30948e-05 ± 1.01736e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 30, 53, 66, 67, 73, 77, 99, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [44, 72, 84, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2942', '1.800', '0.1599', '1.800', '0.0930', '7.000', '0.7076', 1, 1, 1, 1, 1725291064.446814]
VI_after__Init : ['1.201', '0.2943', '1.800', '0.1599', '1.800', '0.0873', '7.000', '0.7076', 1, 1, 1, 1, 1725291072.5571723]
VI_at__the_End : ['1.202', '0.4908', '1.800', '0.1387', '1.803', '0.1140', '7.000', '0.7084', 1, 1, 1, 1, 1725291139.6968281]