TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_17_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-003-10 | FUSED_ID : 6359364768391786554
  IC_TEMP :  -56.45 | VDDM : 1112.27 | AUX_INT :   -8.46 | CsaBias :   77.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26138e-03 / 2
  ADC_P0  : -8.45910e-03 ± 2.40980e-02
  ADC_P1  : 8.68536e-03 ± 6.22523e-04
  ADC_P2  : -5.58367e-06 ± 3.20105e-06
  CSA_Chi2/NDF : 1.57658e-04 / 2
  CSA_P0  : 5.75360e-02 ± 8.37493e-03
  CSA_P1  : 1.01268e-02 ± 6.30990e-04
  CSA_P2  : -5.31100e-05 ± 9.60923e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 34, 67, 98, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [3, 49, 67, 68, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3362', '1.800', '0.1690', '1.799', '0.0913', '7.000', '0.7076', 1, 1, 1, 1, 1725293852.971801]
VI_after__Init : ['1.201', '0.3367', '1.800', '0.1693', '1.800', '0.0859', '7.000', '0.7076', 1, 1, 1, 1, 1725293861.030015]
VI_at__the_End : ['1.201', '0.4804', '1.800', '0.1379', '1.801', '0.1163', '7.000', '0.7083', 1, 1, 1, 1, 1725293921.2543378]