TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_15_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-004-10 | FUSED_ID : 6359364768391786570
  IC_TEMP :  -58.84 | VDDM : 1125.27 | AUX_INT :   -7.94 | CsaBias :   66.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18959e-03 / 2
  ADC_P0  : -7.93568e-03 ± 2.33950e-02
  ADC_P1  : 8.33857e-03 ± 5.80486e-04
  ADC_P2  : -5.22574e-06 ± 2.86012e-06
  CSA_Chi2/NDF : 2.51292e-04 / 2
  CSA_P0  : 5.66518e-02 ± 1.05733e-02
  CSA_P1  : 1.00452e-02 ± 7.96624e-04
  CSA_P2  : -5.23823e-05 ± 1.21316e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [1, 13, 41, 63, 72]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 7, 25, 38, 41, 45, 72, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3301', '1.800', '0.1168', '1.799', '0.0891', '7.000', '0.7074', 1, 1, 1, 1, 1725293756.291476]
VI_after__Init : ['1.201', '0.3307', '1.800', '0.1168', '1.800', '0.0831', '7.000', '0.7076', 1, 1, 1, 1, 1725293764.4328697]
VI_at__the_End : ['1.201', '0.4828', '1.800', '0.1391', '1.800', '0.1149', '7.000', '0.7082', 1, 1, 1, 1, 1725293824.4751124]