TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_12_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-006-10 | FUSED_ID : 6359364768391786602
  IC_TEMP :  -57.83 | VDDM : 1122.70 | AUX_INT :  -17.81 | CsaBias :   66.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50562e-03 / 2
  ADC_P0  : -1.78078e-02 ± 2.68016e-02
  ADC_P1  : 8.47341e-03 ± 6.57937e-04
  ADC_P2  : -5.79999e-06 ± 3.21119e-06
  CSA_Chi2/NDF : 1.80851e-04 / 2
  CSA_P0  : 5.85459e-02 ± 8.96981e-03
  CSA_P1  : 1.01731e-02 ± 6.75811e-04
  CSA_P2  : -5.37204e-05 ± 1.02918e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [55, 65, 68, 79, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [64, 86, 115, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2260', '1.800', '0.1728', '1.800', '0.0926', '7.000', '0.7071', 1, 1, 1, 1, 1725293562.5039518]
VI_after__Init : ['1.201', '0.2264', '1.800', '0.1728', '1.800', '0.0873', '7.000', '0.7076', 1, 1, 1, 1, 1725293570.600259]
VI_at__the_End : ['1.201', '0.4844', '1.800', '0.1364', '1.804', '0.1151', '7.000', '0.7082', 1, 1, 1, 1, 1725293638.7408135]