TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_07_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-009-10 | FUSED_ID : 6359364768391786650
  IC_TEMP :  -56.11 | VDDM : 1109.77 | AUX_INT :   -6.41 | CsaBias :   68.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.56891e-04 / 2
  ADC_P0  : -6.40991e-03 ± 1.98049e-02
  ADC_P1  : 8.40777e-03 ± 4.92341e-04
  ADC_P2  : -5.85138e-06 ± 2.41371e-06
  CSA_Chi2/NDF : 1.50338e-04 / 2
  CSA_P0  : 5.77913e-02 ± 8.17819e-03
  CSA_P1  : 1.00237e-02 ± 6.16167e-04
  CSA_P2  : -4.98766e-05 ± 9.38350e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 13, 16, 46, 90, 96, 119, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [2, 26, 33, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1177', '1.800', '0.1843', '1.800', '0.0828', '7.000', '0.7069', 1, 1, 1, 1, 1725293273.6866572]
VI_after__Init : ['1.202', '0.1177', '1.800', '0.1842', '1.800', '0.0775', '7.000', '0.7068', 1, 1, 1, 1, 1725293281.841036]
VI_at__the_End : ['1.201', '0.4870', '1.800', '0.1392', '1.800', '0.1156', '7.000', '0.7077', 1, 1, 1, 1, 1725293349.2643373]