TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_03_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-012-10 | FUSED_ID : 6359364768391786698
  IC_TEMP :  -56.56 | VDDM : 1124.45 | AUX_INT :   -7.78 | CsaBias :   83.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01945e-03 / 2
  ADC_P0  : -7.77925e-03 ± 2.16248e-02
  ADC_P1  : 8.31409e-03 ± 5.31832e-04
  ADC_P2  : -5.40327e-06 ± 2.59598e-06
  CSA_Chi2/NDF : 1.79352e-04 / 2
  CSA_P0  : 5.79633e-02 ± 8.93254e-03
  CSA_P1  : 9.80388e-03 ± 6.73003e-04
  CSA_P2  : -4.91107e-05 ± 1.02490e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 44, 45, 93, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [21, 50, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3215', '1.800', '0.1599', '1.800', '0.0921', '7.000', '0.7068', 1, 1, 1, 1, 1725292985.4771912]
VI_after__Init : ['1.202', '0.3217', '1.800', '0.1600', '1.801', '0.0863', '7.000', '0.7069', 1, 1, 1, 1, 1725292994.3485804]
VI_at__the_End : ['1.201', '0.4777', '1.800', '0.1354', '1.808', '0.1161', '7.000', '0.7074', 1, 1, 1, 1, 1725293054.3974185]